IIIT Hyderabad Publications |
|||||||||
|
Heuristic Approaches to Improve Product Quality in Large Scale Integrated Software ProductsAuthors: Sai Anirudh Karre,Y.Raghu Babu Reddy Journal: Communications in Computer and Information Science, Springer (link) Volume: 599 Pages: 80-97 Date: 2016-02-14 Report no: IIIT/TR/2016/47 AbstractSoftware quality has always been an important criterion for assessing stability of a product. It is quite challenging for large-scale complex products, especially integrated products, to endure and withstand the competition after a new version release in its market domain. Unlike regular software, integrated software products require detailed exploration on the spread and impact of a defect to improve overall product quality. In this paper, we use heuristic approaches like generalized defect dependency approach, control flow graph based approach, and feature correlation based approach to study the widespread of defects in large software and suggest a metric called defect dependency metric to study the dependency of defects. We implemented the generalized defect dependency approach on an industry dataset and gathered noteworthy results. We provide a comparative a study of the heuristic approaches and comprehended their individual usage with observations. We further discuss the need of adoption of such vision in industries as a standard testing practice to improve quality. Full article: pdf Centre for Software Engineering Research Lab |
||||||||
Copyright © 2009 - IIIT Hyderabad. All Rights Reserved. |