IIIT Hyderabad Publications |
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Statistical Variation Aware Leakage and Total Power Estimation of 16 nm VLSI Digital Circuits Based on Regression ModelsAuthors: Zia Abbas,Deepthi Amuru,Andleeb Zahra Date: 2019-08-18 Report no: IIIT/TR/2019/173 Full paper: pdf Centre for VLSI and Embeded Systems Technology |
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