IIIT Hyderabad Publications |
|||||||||
|
A Highly Accurate Machine Learning Approach to Modelling PVT Variation Aware Leakage Power in FinFET Digital CircuitsAuthors: Zia Abbas,Shirisha Gourishetty,Harshini Mandadapu,Andleeb Zahra Date: 2019-11-11 Report no: IIIT/TR/2019/169 Full paper: pdf Centre for VLSI and Embeded Systems Technology |
||||||||
Copyright © 2009 - IIIT Hyderabad. All Rights Reserved. |